ELECTRON MICROSCOPY
| Sample |
|---|
| CLATHRIN D6 COATS |
| Specimen Preparation | |
|---|---|
| Sample Aggregation State | PARTICLE |
| Vitrification Instrument | FEI VITROBOT MARK I |
| Cryogen Name | ETHANE |
| Sample Vitrification Details | VITRIFIED |
| 3D Reconstruction | |
|---|---|
| Reconstruction Method | SINGLE PARTICLE |
| Number of Particles | 1450 |
| Reported Resolution (Å) | 7.9 |
| Resolution Method | |
| Other Details | THE COORDINATES CONTAIN ONLY A CA TRACE. PLEASE SEE PAPER(NATURE PAPER REFERENCE) FOR FURTHER DETAILS. |
| Refinement Type | |
| Symmetry Type | POINT |
| Point Symmetry | D6 |
| Map-Model Fitting and Refinement | |||||
|---|---|---|---|---|---|
| Id | 1 (1BPO, 1B89) | ||||
| Refinement Space | REAL | ||||
| Refinement Protocol | OTHER | ||||
| Refinement Target | DENSITY CORRELATION | ||||
| Overall B Value | |||||
| Fitting Procedure | |||||
| Details | METHOD--VISUAL REFINEMENT PROTOCOL--MAVE | ||||
| Data Acquisition | |||||||||
|---|---|---|---|---|---|---|---|---|---|
| Detector Type | KODAK SO-163 FILM | ||||||||
| Electron Dose (electrons/Å**2) | 20 | ||||||||
| Imaging Experiment | 1 |
|---|---|
| Date of Experiment | |
| Temperature (Kelvin) | 93 |
| Microscope Model | FEI TECNAI F20 |
| Minimum Defocus (nm) | 2000 |
| Maximum Defocus (nm) | 5000 |
| Minimum Tilt Angle (degrees) | |
| Maximum Tilt Angle (degrees) | |
| Nominal CS | 2 |
| Imaging Mode | BRIGHT FIELD |
| Specimen Holder Model | |
| Nominal Magnification | 50000 |
| Calibrated Magnification | 51160 |
| Source | FIELD EMISSION GUN |
| Acceleration Voltage (kV) | 200 |
| Imaging Details | LOW DOSE |
| EM Software | ||
|---|---|---|
| Task | Software Package | Version |
| MODEL FITTING | O | |
| RECONSTRUCTION | FREALIGN | |
| RECONSTRUCTION | IMAGIC | |
| Image Processing | ||||
|---|---|---|---|---|
| CTF Correction Type | CTF Correction Details | Number of Particles Selected | Particle Selection Details | |
| CTFTILT, FREALIGN V.6.07 | ||||
