RT XFEL structure of the dark-stable state of Photosystem II (0F, S1-rich) at 2.05 Angstrom resolution
Serial Crystallography (SX)  
Serial Crystallography (SX)  
Serial Crystallography (SX)  
Starting Model(s)
| Initial Refinement Model(s) | 
|---|
| Type | Source | Accession Code | Details | 
|---|
|
experimental model | PDB |  5KAF |   | 
Crystallization
| Crystalization Experiments | 
|---|
| ID | Method | pH | Temperature | Details | 
|---|
| 1 | BATCH MODE | 6.5 | 298 | 0.1 M MES pH 6.5, 0.1 M NH4Cl, 35% (w/v) PEG 5000 | 
| Crystal Properties | 
|---|
| Matthews coefficient | Solvent content | 
|---|
| 3.4 | 63.79 | 
Crystal Data
| Unit Cell | 
|---|
| Length ( Å ) | Angle ( ˚ ) | 
|---|
| a = 116.906 | α = 90 | 
| b = 221.407 | β = 90 | 
| c = 308.668 | γ = 90 | 
| Symmetry | 
|---|
| Space Group | P 21 21 21 | 
|---|
Diffraction
| Diffraction Experiment | 
|---|
| ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | 
|---|
| 1 | 1 | x-ray | 298 | CCD | RAYONIX MX170-HS | Compound refractive lenses | 2016-07-14 | M | SINGLE WAVELENGTH | 
| 3 | 1 | x-ray | 298 | CCD | RAYONIX MX170-HS | Compound refractive lenses | 2017-07-13 | M | SINGLE WAVELENGTH | 
| 2 | 1 | x-ray | 298 | CCD | RAYONIX MX170-HS | Compound refractive lenses | 2016-10-20 | M | SINGLE WAVELENGTH | 
| Radiation Source | 
|---|
| ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline | 
|---|
| 1 | FREE ELECTRON LASER | SLAC LCLS BEAMLINE MFX | 1.305 | SLAC LCLS | MFX | 
| 3 | FREE ELECTRON LASER | SLAC LCLS BEAMLINE MFX | 1.305 | SLAC LCLS | MFX | 
| 2 | FREE ELECTRON LASER | SLAC LCLS BEAMLINE MFX | 1.305 | SLAC LCLS | MFX | 
Serial Crystallography
| Sample delivery method | 
|---|
| Diffraction ID | Description | Sample Delivery Method | 
|---|
| 1 |  | fixed target | 
| Measurement | 
|---|
| Diffraction ID | Pulse Duration | Pulse Repetition Rate | Focal Spot Size | Pulse Energy | Photons Per Pulse | 
|---|
| 1 | 40 (fs) | 10 | 3 | 9.515 (KeV) |  | 
| Data Reduction | 
|---|
| Diffraction ID | Frames Indexed | Crystal Hits | Frames Indexed | Latices Merged | 
|---|
| 1 |  |  |  |  | 
Data Collection
| Overall | 
|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | CC (Half) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot | 
|---|
| 1 | 2.05 | 30.55 | 99.96 | 0.987 | 16.581 | 245.79 |  | 497372 |  |  | 33.09 | 
| Highest Resolution Shell | 
|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | CC (Half) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) | 
|---|
 | 2.05 | 2.085 | 99.95 |  | 0.018 | 0.53 | 12.58 |  | 
Refinement
| Statistics | 
|---|
| Diffraction ID | Structure Solution Method | Cross Validation method | Starting model | Resolution (High) | Resolution (Low) | Cut-off Sigma (F) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (Observed) | R-Work (Depositor) | R-Work (DCC) | R-Free (Depositor) | R-Free (DCC) | Mean Isotropic B | 
|---|
| X-RAY DIFFRACTION | MOLECULAR REPLACEMENT | THROUGHOUT | 5KAF | 2.05 | 30.552 | 1.33 | 496416 | 4403 | 99.8 | 0.1851 | 0.1846 | 0.18 | 0.2413 | 0.24 | 45.0801 | 
| Temperature Factor Modeling | 
|---|
| Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] | 
|---|
 |  |  |  |  |  | 
| Non-Hydrogen Atoms Used in Refinement | 
|---|
| Non-Hydrogen Atoms | Number | 
|---|
| Protein Atoms | 41576 | 
| Nucleic Acid Atoms |  | 
| Solvent Atoms | 1882 | 
| Heterogen Atoms | 19177 | 
Software
| Software | 
|---|
| Software Name | Purpose | 
|---|
| PHENIX | refinement | 
| PDB_EXTRACT | data extraction | 
| cctbx.xfel | data reduction | 
| PHASER | phasing |