Liquid Application Method for time-resolved Analyses (LAMA) by serial synchrotron crystallography, Xylose Isomerase 0ms timepoint
Serial Crystallography (SX)  
Crystallization
| Crystalization Experiments | 
|---|
| ID | Method | pH | Temperature | Details | 
|---|
| 1 | BATCH MODE |  | 293 | 35% (w/v) PEG3350, 200 mM lithium sulfate and 10 mM Hepes/NaOH pH 7.5 | 
| Crystal Properties | 
|---|
| Matthews coefficient | Solvent content | 
|---|
| 2.37 | 48.14 | 
Crystal Data
| Unit Cell | 
|---|
| Length ( Å ) | Angle ( ˚ ) | 
|---|
| a = 94.74 | α = 90 | 
| b = 99.17 | β = 90 | 
| c = 87.41 | γ = 90 | 
| Symmetry | 
|---|
| Space Group | I 2 2 2 | 
|---|
Diffraction
| Diffraction Experiment | 
|---|
| ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | 
|---|
| 1 | 1 | x-ray | 293 | PIXEL | DECTRIS EIGER X 16M |  | 2018-09-20 | M | SINGLE WAVELENGTH | 
| Radiation Source | 
|---|
| ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline | 
|---|
| 1 | SYNCHROTRON | PETRA III, EMBL c/o DESY BEAMLINE P14 (MX2) | 0.9793 | PETRA III, EMBL c/o DESY | P14 (MX2) | 
Serial Crystallography
| Sample delivery method | 
|---|
| Diffraction ID | Description | Sample Delivery Method | 
|---|
| 1 |  | fixed target | 
Data Collection
| Overall | 
|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot | 
|---|
| 1 | 1.849 | 49.585 | 99.83 | 6.1 | 147.5 |  | 35460 |  |  |  | 
| Highest Resolution Shell | 
|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) | 
|---|
| 1 | 1.849 | 1.92 |  |  |  |  |  | 
Refinement
| Statistics | 
|---|
| Diffraction ID | Structure Solution Method | Cross Validation method | Resolution (High) | Resolution (Low) | Cut-off Sigma (F) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (Observed) | R-Work (Depositor) | R-Work (DCC) | R-Free (Depositor) | R-Free (DCC) | Mean Isotropic B | 
|---|
| X-RAY DIFFRACTION |  | FREE R-VALUE | 1.849 | 49.585 | 1.34 | 35460 | 1737 | 99.84 | 0.1661 | 0.1645 | 0.16 | 0.1961 | 0.2 |  | 
| Temperature Factor Modeling | 
|---|
| Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] | 
|---|
|  |  |  |  |  |  | 
| RMS Deviations | 
|---|
| Key | Refinement Restraint Deviation | 
|---|
| f_dihedral_angle_d | 6.459 | 
| f_angle_d | 0.894 | 
| f_chiral_restr | 0.055 | 
| f_bond_d | 0.008 | 
| f_plane_restr | 0.007 | 
| Non-Hydrogen Atoms Used in Refinement | 
|---|
| Non-Hydrogen Atoms | Number | 
|---|
| Protein Atoms | 3046 | 
| Nucleic Acid Atoms |  | 
| Solvent Atoms | 255 | 
| Heterogen Atoms | 2 | 
Software
| Software | 
|---|
| Software Name | Purpose | 
|---|
| PHENIX | refinement | 
| XDS | data reduction | 
| XSCALE | data scaling | 
| PHASER | phasing |