X-RAY DIFFRACTION
Starting Model(s)
| Initial Refinement Model(s) | |||
|---|---|---|---|
| Type | Source | Accession Code | Details | 
| experimental model | PDB | 1OQ5 | pdb entry 1OQ5 | 
Crystallization
| Crystalization Experiments | ||||
|---|---|---|---|---|
| ID | Method | pH | Temperature | Details | 
| 1 | VAPOR DIFFUSION, SITTING DROP | 8 | 277 | 2.5 M ammonium sulfate, 0.1 M tris hydrochloride, 0.3 M natrium chloride, 0.15 mM p-Chlormercuricbenzoic acid, pH 8.0, VAPOR DIFFUSION, SITTING DROP, temperature 277K | 
| Crystal Properties | |
|---|---|
| Matthews coefficient | Solvent content | 
| 2.08 | 40.95 | 
Crystal Data
| Unit Cell | |
|---|---|
| Length ( Å ) | Angle ( ˚ ) | 
| a = 42.2 | α = 90 | 
| b = 41.4 | β = 104.6 | 
| c = 72.2 | γ = 90 | 
| Symmetry | |
|---|---|
| Space Group | P 1 21 1 | 
Diffraction
| Diffraction Experiment | ||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | |||||
| 1 | 1 | x-ray | 113 | IMAGE PLATE | RIGAKU RAXIS IV++ | osmic mirrors | 2007-01-25 | M | SINGLE WAVELENGTH | |||||
| Radiation Source | |||||
|---|---|---|---|---|---|
| ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline | 
| 1 | ROTATING ANODE | RIGAKU RUH3R | 1.54178 | ||
Data Collection
| Overall | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | R Sym I (Observed) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot | ||||||||
| 1 | 1.95 | 20 | 93.2 | 0.064 | 13.5 | 2.4 | 16649 | 16649 | 17.2 | ||||||||||
| Highest Resolution Shell | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | R-Sym I (Observed) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) | |||||||||||
| 1 | 1.95 | 2 | 61.7 | 0.21 | 3.4 | 1.8 | 734 | ||||||||||||
Refinement
| Statistics | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Diffraction ID | Structure Solution Method | Cross Validation method | Starting model | Resolution (High) | Resolution (Low) | Number Reflections (All) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (All) | R-Factor (Observed) | R-Work (Depositor) | R-Work (DCC) | R-Free (Depositor) | R-Free (DCC) | R-Free Selection Details | Mean Isotropic B | ||
| X-RAY DIFFRACTION | MOLECULAR REPLACEMENT | FREE R | pdb entry 1OQ5 | 1.95 | 20 | 16249 | 16249 | 798 | 90.9 | 0.1841 | 0.1841 | 0.1816 | 0.19 | 0.2602 | 0.21 | RANDOM | |||
| Temperature Factor Modeling | ||||||
|---|---|---|---|---|---|---|
| Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] | |
| Coordinate Error | ||
|---|---|---|
| Structure Solution Method | Refinement High Resolution | Refinement Low Resolution | 
| 5 | 1989.62 | 2306.08 | 
| RMS Deviations | |
|---|---|
| Key | Refinement Restraint Deviation | 
| s_non_zero_chiral_vol | 0.034 | 
| s_zero_chiral_vol | 0.029 | 
| s_from_restr_planes | 0.0265 | 
| s_angle_d | 0.021 | 
| s_anti_bump_dis_restr | 0.013 | 
| s_similar_adp_cmpnt | 0.008 | 
| s_bond_d | 0.005 | 
| s_similar_dist | |
| s_rigid_bond_adp_cmpnt | |
| s_approx_iso_adps | |
| Non-Hydrogen Atoms Used in Refinement | |
|---|---|
| Non-Hydrogen Atoms | Number | 
| Protein Atoms | 2039 | 
| Nucleic Acid Atoms | |
| Solvent Atoms | 214 | 
| Heterogen Atoms | 53 | 
Software
| Software | |
|---|---|
| Software Name | Purpose | 
| SHELX | model building | 
| SHELXL-97 | refinement | 
| CrystalClear | data collection | 
| HKL-2000 | data reduction | 
| HKL-2000 | data scaling | 
| PHASER | phasing | 














