ELECTRON MICROSCOPY
| Sample |
|---|
| actin filament in the presence of phosphate |
| Specimen Preparation | |
|---|---|
| Sample Aggregation State | FILAMENT |
| Vitrification Instrument | |
| Cryogen Name | ETHANE |
| Sample Vitrification Details | |
| 3D Reconstruction | |
|---|---|
| Reconstruction Method | SINGLE PARTICLE |
| Number of Particles | 8000 |
| Reported Resolution (Å) | 6 |
| Resolution Method | |
| Other Details | |
| Refinement Type | |
| Symmetry Type | HELICAL |
| Map-Model Fitting and Refinement | |||||
|---|---|---|---|---|---|
| Id | 1 | ||||
| Refinement Space | REAL | ||||
| Refinement Protocol | FLEXIBLE FIT | ||||
| Refinement Target | pdbRhofit (Yasunaga & Wakabayashi, 1996) | ||||
| Overall B Value | |||||
| Fitting Procedure | |||||
| Details | METHOD--local refinement REFINEMENT PROTOCOL--real-space refinement | ||||
| Data Acquisition | |||||||||
|---|---|---|---|---|---|---|---|---|---|
| Detector Type | GENERIC CCD | ||||||||
| Electron Dose (electrons/Å**2) | 15 | ||||||||
| Imaging Experiment | 1 |
|---|---|
| Date of Experiment | |
| Temperature (Kelvin) | 77 |
| Microscope Model | HITACHI EF2000 |
| Minimum Defocus (nm) | 1000 |
| Maximum Defocus (nm) | 1500 |
| Minimum Tilt Angle (degrees) | |
| Maximum Tilt Angle (degrees) | |
| Nominal CS | |
| Imaging Mode | BRIGHT FIELD |
| Specimen Holder Model | GATAN LIQUID NITROGEN |
| Nominal Magnification | 100000 |
| Calibrated Magnification | |
| Source | FIELD EMISSION GUN |
| Acceleration Voltage (kV) | 200 |
| Imaging Details |
| EM Software | ||
|---|---|---|
| Task | Software Package | Version |
| MODEL FITTING | NAMD | |
| MODEL FITTING | O | |
| RECONSTRUCTION | EOS | |
| Image Processing | ||||
|---|---|---|---|---|
| CTF Correction Type | CTF Correction Details | Number of Particles Selected | Particle Selection Details | |
| FSC at 0.143 cut-off | ||||
