X-RAY DIFFRACTION
Starting Model(s)
| Initial Refinement Model(s) | |||
|---|---|---|---|
| Type | Source | Accession Code | Details | 
| experimental model | PDB | 3EU5 | |
Crystallization
| Crystalization Experiments | ||||
|---|---|---|---|---|
| ID | Method | pH | Temperature | Details | 
| 1 | VAPOR DIFFUSION, HANGING DROP | 7.5 | 292 | 20% (w/v) PEG 4000, 0.2M MgCl2, 0.1M Tris, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 292K | 
| Crystal Properties | |
|---|---|
| Matthews coefficient | Solvent content | 
| 3.26 | 62.26 | 
Crystal Data
| Unit Cell | |
|---|---|
| Length ( Å ) | Angle ( ˚ ) | 
| a = 172.397 | α = 90 | 
| b = 172.397 | β = 90 | 
| c = 69.781 | γ = 120 | 
| Symmetry | |
|---|---|
| Space Group | P 61 | 
Diffraction
| Diffraction Experiment | ||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | |||||
| 1 | 1 | x-ray | 100 | CCD | MARMOSAIC 225 mm CCD | 2009-11-01 | M | SINGLE WAVELENGTH | ||||||
| Radiation Source | |||||
|---|---|---|---|---|---|
| ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline | 
| 1 | SYNCHROTRON | SLS BEAMLINE X10SA | 1.0000 | SLS | X10SA | 
Data Collection
| Overall | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | R Sym I (Observed) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot | ||||||||
| 1 | 2.6 | 29.91 | 99.9 | 0.082 | 16.3 | 5.6 | 36661 | 36611 | 43.2 | ||||||||||
| Highest Resolution Shell | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | R-Sym I (Observed) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) | |||||||||||
| 1 | 2.6 | 2.7 | 99.9 | 0.381 | 5.3 | 5.5 | |||||||||||||
Refinement
| Statistics | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Diffraction ID | Structure Solution Method | Cross Validation method | Starting model | Resolution (High) | Resolution (Low) | Number Reflections (All) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (Observed) | R-Work (Depositor) | R-Work (DCC) | R-Free (Depositor) | R-Free (DCC) | R-Free Selection Details | Mean Isotropic B | |||
| X-RAY DIFFRACTION | MOLECULAR REPLACEMENT | THROUGHOUT | 3EU5 | 2.6 | 29.91 | 36661 | 34781 | 1809 | 99.89 | 0.17383 | 0.17123 | 0.19 | 0.22269 | 0.23 | RANDOM | 37.122 | |||
| Temperature Factor Modeling | ||||||
|---|---|---|---|---|---|---|
| Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] | |
| 1.29 | 0.64 | 1.29 | -1.93 | |||
| RMS Deviations | |
|---|---|
| Key | Refinement Restraint Deviation | 
| r_dihedral_angle_2_deg | 36.505 | 
| r_dihedral_angle_4_deg | 20.283 | 
| r_dihedral_angle_3_deg | 17.653 | 
| r_dihedral_angle_1_deg | 5.99 | 
| r_scangle_it | 4.728 | 
| r_angle_other_deg | 4.093 | 
| r_scbond_it | 3.095 | 
| r_mcangle_it | 2.157 | 
| r_mcbond_other | 1.622 | 
| r_angle_refined_deg | 1.603 | 
| Non-Hydrogen Atoms Used in Refinement | |
|---|---|
| Non-Hydrogen Atoms | Number | 
| Protein Atoms | 5824 | 
| Nucleic Acid Atoms | |
| Solvent Atoms | 244 | 
| Heterogen Atoms | 74 | 
Software
| Software | |
|---|---|
| Software Name | Purpose | 
| MOSFLM | data reduction | 
| PHASES | phasing | 
| REFMAC | refinement | 
| XDS | data reduction | 
| XSCALE | data scaling | 














