X-RAY DIFFRACTION
Crystallization
| Crystalization Experiments | ||||
|---|---|---|---|---|
| ID | Method | pH | Temperature | Details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 8.5 | 293.15 | 20% PEG 400, 0.18M MAGNESIUM ACETATE, 0.05M TRIS CHLORIDE, PH 8.5, VAPOR DIFFUSION, SITTING DROP, TEMPERATURE 293.15K. 15% PEG 400, 0.165M MAGNESIUM ACETATE, 0.05M TRIS CHLORIDE, PH 8.5, VAPOR DIFFUSION, SITTING DROP, TEMPERATURE 293.15K |
| 2 | VAPOR DIFFUSION, SITTING DROP | 8.5 | 293.15 | 15% PEG 400, 0.165M MAGNESIUM ACETATE, 0.05M TRIS CHLORIDE, PH 8.5, VAPOR DIFFUSION, SITTING DROP, TEMPERATURE 293.15K |
Crystal Data
| Unit Cell | |
|---|---|
| Length ( Å ) | Angle ( ˚ ) |
| a = 45.745 | α = 90 |
| b = 45.745 | β = 90 |
| c = 45.745 | γ = 90 |
| Symmetry | |
|---|---|
| Space Group | P 21 3 |
Diffraction
| Diffraction Experiment | ||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | |||||
| 1 | 1 | x-ray | 100 | CCD | MARMOSAIC 225 mm CCD | MIRROR, BARTELS MONOCHROMATOR, DUAL CHANNEL CUT CRYSTALS, TOROIDAL MIRROR | 2009-12-10 | M | SINGLE WAVELENGTH | |||||
| 2 | 2 | x-ray | 100 | CCD | MARMOSAIC 225 mm CCD | MIRROR, BARTELS MONOCHROMATOR, DUAL CHANNEL CUT CRYSTALS, TOROIDAL MIRROR | 2009-09-12 | M | MAD | |||||
| Radiation Source | |||||
|---|---|---|---|---|---|
| ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline |
| 1 | SYNCHROTRON | SLS BEAMLINE X06DA | 0.9999 | SLS | X06DA |
| 2 | SYNCHROTRON | SLS BEAMLINE X06DA | 0.9999 | SLS | X06DA |
Data Collection
| Overall | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | R Merge I (Observed) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot | ||||||||
| 1,2 | 1.91 | 45.745 | 99.7 | 0.0204 | 27.06 | 7.5 | 4826 | 4030 | 4 | 2 | |||||||||
| Highest Resolution Shell | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | R Merge I (Observed) | R-Sym I (Observed) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) | ||||||||||
| 1,2 | 1.91 | 2.01 | 98.7 | 0.3847 | 0.3847 | 2.67 | 0.99 | 703 | |||||||||||
Refinement
| Statistics | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Diffraction ID | Structure Solution Method | Resolution (High) | Resolution (Low) | Cut-off Sigma (I) | Cut-off Sigma (F) | Number Reflections (All) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Work (Depositor) | R-Work (DCC) | R-Free (Depositor) | R-Free (DCC) | R-Free Selection Details | Mean Isotropic B | ||||
| X-RAY DIFFRACTION | MAD | 1.91 | 26.41 | 2 | 4 | 4814 | 4030 | 242 | 83.7 | 0.224 | 0.19 | 0.2709 | 0.24 | RANDOM | 51.2 | ||||
| Temperature Factor Modeling | ||||||
|---|---|---|---|---|---|---|
| Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] | |
| RMS Deviations | |
|---|---|
| Key | Refinement Restraint Deviation |
| SIMU | 0.164 |
| s_from_restr_planes | 0.04 |
| s_angle_d | 0.027 |
| s_bond_d | 0.009 |
| s_non_zero_chiral_vol | 0.008 |
| s_anti_bump_dis_restr | 0.004 |
| Non-Hydrogen Atoms Used in Refinement | |
|---|---|
| Non-Hydrogen Atoms | Number |
| Protein Atoms | |
| Nucleic Acid Atoms | 125 |
| Solvent Atoms | 39 |
| Heterogen Atoms | 62 |
Software
| Software | |
|---|---|
| Software Name | Purpose |
| RemDAq | data collection |
| SHELXD | phasing |
| SHELXL-97 | refinement |
| XDS | data reduction |
| XPREP | data reduction |














