X-RAY DIFFRACTION
Crystallization
| Crystalization Experiments | ||||
|---|---|---|---|---|
| ID | Method | pH | Temperature | Details | 
| 1 | VAPOR DIFFUSION, HANGING DROP | 6 | 291 | 10% PEG MME 550, 100 mmol L-1 MES, 50 mmol L-1 ZnSO4, pH 6.0, VAPOR DIFFUSION, HANGING DROP, temperature 291K | 
| Crystal Properties | |
|---|---|
| Matthews coefficient | Solvent content | 
| 2.82 | 56.46 | 
Crystal Data
| Unit Cell | |
|---|---|
| Length ( Å ) | Angle ( ˚ ) | 
| a = 78.11 | α = 90 | 
| b = 78.11 | β = 90 | 
| c = 102.81 | γ = 120 | 
| Symmetry | |
|---|---|
| Space Group | P 63 2 2 | 
Diffraction
| Diffraction Experiment | ||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | |||||
| 1 | 1 | x-ray | 100 | IMAGE PLATE | MAR scanner 345 mm plate | Silicon, active surface 50 nm Rh-coated mirrors | 2003-05-24 | M | MAD | |||||
| Radiation Source | |||||
|---|---|---|---|---|---|
| ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline | 
| 1 | SYNCHROTRON | BESSY BEAMLINE 14.2 | 0.90, 1.28257, 1.28314 | BESSY | 14.2 | 
Data Collection
| Overall | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | R Sym I (Observed) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot | ||||||||
| 1 | 0.97 | 20 | 98.8 | 0.066 | 35.3 | 7 | 107732 | 107732 | |||||||||||
| Highest Resolution Shell | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | R-Sym I (Observed) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) | |||||||||||
| 1 | 0.97 | 0.99 | 95.5 | 0.515 | 2.2 | 4.2 | 5120 | ||||||||||||
Refinement
| Statistics | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Diffraction ID | Structure Solution Method | Cross Validation method | Resolution (High) | Resolution (Low) | Number Reflections (All) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (All) | R-Factor (Observed) | R-Work (Depositor) | R-Work (DCC) | R-Free (Depositor) | R-Free (DCC) | R-Free Selection Details | Mean Isotropic B | |||
| X-RAY DIFFRACTION | MAD | FREE R | 0.97 | 20 | 107706 | 102318 | 5388 | 98.8 | 0.1459 | 0.1459 | 0.1456 | 0.14 | 0.159 | 0.16 | RANDOM | ||||
| Temperature Factor Modeling | ||||||
|---|---|---|---|---|---|---|
| Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] | |
| Coordinate Error | ||
|---|---|---|
| Structure Solution Method | Refinement High Resolution | Refinement Low Resolution | 
| 18 | 1243 | |
| RMS Deviations | |
|---|---|
| Key | Refinement Restraint Deviation | 
| s_from_restr_planes | 0.4008 | 
| s_approx_iso_adps | 0.1304 | 
| s_anti_bump_dis_restr | 0.1146 | 
| s_angle_d | 0.0324 | 
| s_similar_adp_cmpnt | 0.03 | 
| s_bond_d | 0.0167 | 
| s_rigid_bond_adp_cmpnt | 0.0105 | 
| Non-Hydrogen Atoms Used in Refinement | |
|---|---|
| Non-Hydrogen Atoms | Number | 
| Protein Atoms | 1093 | 
| Nucleic Acid Atoms | |
| Solvent Atoms | 148 | 
| Heterogen Atoms | 6 | 
Software
| Software | |
|---|---|
| Software Name | Purpose | 
| MAR345dtb | data collection | 
| SHELXD | phasing | 
| SHELXL-97 | refinement | 
| HKL-2000 | data reduction | 
| HKL-2000 | data scaling | 














