X-RAY DIFFRACTION
Crystallization
| Crystalization Experiments | ||||
|---|---|---|---|---|
| ID | Method | pH | Temperature | Details | 
| 1 | VAPOR DIFFUSION, SITTING DROP | 300 | 100mM BisTris, 200 mM NaCl, 5 mM YbCl3, 9-11% PEG3350 | |
| Crystal Properties | |
|---|---|
| Matthews coefficient | Solvent content | 
| 2.27 | 45.82 | 
Crystal Data
| Unit Cell | |
|---|---|
| Length ( Å ) | Angle ( ˚ ) | 
| a = 108.94 | α = 90 | 
| b = 108.94 | β = 90 | 
| c = 83.189 | γ = 90 | 
| Symmetry | |
|---|---|
| Space Group | P 4 2 2 | 
Diffraction
| Diffraction Experiment | ||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | |||||
| 1 | 1 | x-ray | 100 | PIXEL | DECTRIS PILATUS3 6M | 2016-03-02 | M | SINGLE WAVELENGTH | ||||||
| Radiation Source | |||||
|---|---|---|---|---|---|
| ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline | 
| 1 | SYNCHROTRON | APS BEAMLINE 19-ID | 0.98 | APS | 19-ID | 
Data Collection
| Overall | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | R Merge I (Observed) | Rrim I (All) | Rpim I (All) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot | ||||||
| 1 | 1.7 | 50 | 98.9 | 0.099 | 0.108 | 0.041 | 8.9 | 6.4 | 54840 | ||||||||||
| Highest Resolution Shell | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | R Merge I (Observed) | Rrim I (All) | Rpim I (All) | CC (Half) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) | ||||||||
| 1 | 1.7 | 1.73 | 100 | 0.654 | 0.716 | 0.284 | 0.637 | 6.1 | 2748 | ||||||||||
Refinement
| Statistics | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Diffraction ID | Structure Solution Method | Cross Validation method | Resolution (High) | Resolution (Low) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (Observed) | R-Work (Depositor) | R-Work (DCC) | R-Free (Depositor) | R-Free (DCC) | R-Free Selection Details | Mean Isotropic B | |||||
| X-RAY DIFFRACTION | THROUGHOUT | 1.7 | 50 | 52057 | 2782 | 98.83 | 0.216 | 0.2146 | 0.2195 | 0.2433 | 0.2409 | RANDOM | 39.749 | ||||||
| Temperature Factor Modeling | ||||||
|---|---|---|---|---|---|---|
| Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] | |
| 1.02 | 1.02 | -2.04 | ||||
| RMS Deviations | |
|---|---|
| Key | Refinement Restraint Deviation | 
| r_dihedral_angle_2_deg | 35.584 | 
| r_dihedral_angle_4_deg | 15.846 | 
| r_dihedral_angle_3_deg | 14.422 | 
| r_dihedral_angle_1_deg | 6.117 | 
| r_angle_refined_deg | 1.373 | 
| r_angle_other_deg | 0.783 | 
| r_chiral_restr | 0.079 | 
| r_bond_refined_d | 0.01 | 
| r_gen_planes_refined | 0.006 | 
| r_bond_other_d | 0.001 | 
| Non-Hydrogen Atoms Used in Refinement | |
|---|---|
| Non-Hydrogen Atoms | Number | 
| Protein Atoms | 3776 | 
| Nucleic Acid Atoms | |
| Solvent Atoms | 283 | 
| Heterogen Atoms | 26 | 
Software
| Software | |
|---|---|
| Software Name | Purpose | 
| REFMAC | refinement | 
| PDB_EXTRACT | data extraction | 
| HKL-3000 | data reduction | 














