PanDDA analysis group deposition -- Aar2/RNaseH in complex with fragment F2X-Entry G04a
X-RAY DIFFRACTION
Crystallization
| Crystalization Experiments | ||||
|---|---|---|---|---|
| ID | Method | pH | Temperature | Details | 
| 1 | VAPOR DIFFUSION, SITTING DROP | 8.5 | 293 | 19% (w/v) Peg 4000, 3% (v/v) DMSO, 0.1M Tris-HCl pH 8.5, 0.2M Li2SO4 | 
| Crystal Properties | |
|---|---|
| Matthews coefficient | Solvent content | 
| 2.45 | 49.86 | 
Crystal Data
| Unit Cell | |
|---|---|
| Length ( Å ) | Angle ( ˚ ) | 
| a = 88.617 | α = 90 | 
| b = 81.712 | β = 109.03 | 
| c = 94.201 | γ = 90 | 
| Symmetry | |
|---|---|
| Space Group | C 1 2 1 | 
Diffraction
| Diffraction Experiment | ||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | |||||
| 1 | 1 | x-ray | 100 | PIXEL | DECTRIS EIGER X 16M | 2019-06-22 | M | SINGLE WAVELENGTH | ||||||
| Radiation Source | |||||
|---|---|---|---|---|---|
| ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline | 
| 1 | SYNCHROTRON | MAX IV BEAMLINE BioMAX | 0.827 | MAX IV | BioMAX | 
Data Collection
| Overall | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | R Merge I (Observed) | Rrim I (All) | CC (Half) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot | ||||||
| 1 | 1.47 | 44.56 | 98.7 | 0.066 | 0.071 | 0.999 | 11.37 | 6.841 | 101849 | 35.093 | |||||||||
| Highest Resolution Shell | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | R Merge I (Observed) | Rrim I (All) | CC (Half) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) | |||||||||
| 1 | 1.47 | 1.55 | 0.944 | 2.324 | 2.509 | 0.347 | 0.39 | 6.45 | 17505 | ||||||||||
Refinement
| Statistics | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Diffraction ID | Structure Solution Method | Cross Validation method | Resolution (High) | Resolution (Low) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (Observed) | R-Work (Depositor) | R-Work (DCC) | R-Free (Depositor) | R-Free (DCC) | R-Free Selection Details | Mean Isotropic B | |||||
| X-RAY DIFFRACTION | FOURIER SYNTHESIS | THROUGHOUT | 1.47 | 44.56 | 101849 | 5445 | 98.59 | 0.2295 | 0.22843 | 0.24 | 0.22946 | 0.24 | RANDOM | 29.737 | |||||
| Temperature Factor Modeling | ||||||
|---|---|---|---|---|---|---|
| Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] | |
| 1.46 | -0.08 | -1.11 | -0.23 | |||
| RMS Deviations | |
|---|---|
| Key | Refinement Restraint Deviation | 
| r_dihedral_angle_2_deg | 34.644 | 
| r_dihedral_angle_4_deg | 17.626 | 
| r_dihedral_angle_3_deg | 13.393 | 
| r_dihedral_angle_1_deg | 6.508 | 
| r_mcangle_it | 3.507 | 
| r_mcbond_it | 2.431 | 
| r_mcbond_other | 2.429 | 
| r_angle_refined_deg | 1.487 | 
| r_angle_other_deg | 1.397 | 
| r_chiral_restr | 0.075 | 
| Non-Hydrogen Atoms Used in Refinement | |
|---|---|
| Non-Hydrogen Atoms | Number | 
| Protein Atoms | 4537 | 
| Nucleic Acid Atoms | |
| Solvent Atoms | 140 | 
| Heterogen Atoms | 42 | 
Software
| Software | |
|---|---|
| Software Name | Purpose | 
| XSCALE | data scaling | 
| REFMAC | refinement | 
| PDB_EXTRACT | data extraction | 
| XDS | data reduction | 
| REFMAC | phasing | 
| PHENIX | refinement | 














