X-RAY DIFFRACTION
Starting Model(s)
| Initial Refinement Model(s) | |||
|---|---|---|---|
| Type | Source | Accession Code | Details | 
| experimental model | PDB | 6FAX | |
Crystallization
| Crystalization Experiments | ||||
|---|---|---|---|---|
| ID | Method | pH | Temperature | Details | 
| 1 | VAPOR DIFFUSION, SITTING DROP | 6 | 293 | PEG 4000, cacodylate | 
| Crystal Properties | |
|---|---|
| Matthews coefficient | Solvent content | 
| 3.09 | 60.14 | 
Crystal Data
| Unit Cell | |
|---|---|
| Length ( Å ) | Angle ( ˚ ) | 
| a = 148.204 | α = 90 | 
| b = 148.204 | β = 90 | 
| c = 45.652 | γ = 120 | 
| Symmetry | |
|---|---|
| Space Group | P 3 2 1 | 
Diffraction
| Diffraction Experiment | ||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | |||||
| 1 | 1 | x-ray | 80 | PIXEL | DECTRIS PILATUS 12M | 2019-08-02 | M | SINGLE WAVELENGTH | ||||||
| Radiation Source | |||||
|---|---|---|---|---|---|
| ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline | 
| 1 | SYNCHROTRON | DIAMOND BEAMLINE I23 | 2.755 | Diamond | I23 | 
Data Collection
| Overall | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | R Merge I (Observed) | Rrim I (All) | Rpim I (All) | CC (Half) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot | |||||
| 1 | 2.35 | 128.35 | 92.4 | 0.116 | 0.129 | 0.036 | 0.998 | 14.5 | 12 | 22283 | |||||||||
| Highest Resolution Shell | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | Rpim I (All) | CC (Half) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) | ||||||||||
| 1 | 2.35 | 2.43 | 83.3 | 0.771 | 0.373 | 0.9 | 10.3 | ||||||||||||
Refinement
| Statistics | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Diffraction ID | Structure Solution Method | Cross Validation method | Starting model | Resolution (High) | Resolution (Low) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (All) | R-Work (Depositor) | R-Work (DCC) | R-Free (Depositor) | R-Free (DCC) | Mean Isotropic B | |||||
| X-RAY DIFFRACTION | SAD | THROUGHOUT | 6FAX | 2.35 | 128.348 | 22281 | 1092 | 92.097 | 0.194 | 0.1918 | 0.2 | 0.2453 | 0.25 | 50.985 | |||||
| Temperature Factor Modeling | ||||||
|---|---|---|---|---|---|---|
| Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] | |
| 0.153 | 0.076 | 0.153 | -0.496 | |||
| RMS Deviations | |
|---|---|
| Key | Refinement Restraint Deviation | 
| r_dihedral_angle_2_deg | 37.556 | 
| r_dihedral_angle_4_deg | 19.654 | 
| r_dihedral_angle_3_deg | 16.36 | 
| r_lrange_it | 9.268 | 
| r_lrange_other | 9.267 | 
| r_dihedral_angle_1_deg | 8.611 | 
| r_scangle_it | 6.888 | 
| r_scangle_other | 6.887 | 
| r_mcangle_it | 6.08 | 
| r_mcangle_other | 6.08 | 
| Non-Hydrogen Atoms Used in Refinement | |
|---|---|
| Non-Hydrogen Atoms | Number | 
| Protein Atoms | 3266 | 
| Nucleic Acid Atoms | |
| Solvent Atoms | 121 | 
| Heterogen Atoms | |
Software
| Software | |
|---|---|
| Software Name | Purpose | 
| REFMAC | refinement | 
| XDS | data reduction | 
| Aimless | data scaling | 
| CRANK2 | phasing | 














