X-RAY DIFFRACTION
Crystallization
| Crystalization Experiments | ||||
|---|---|---|---|---|
| ID | Method | pH | Temperature | Details |
| 1 | VAPOR DIFFUSION | 5.9 | 293 | 1.75 M ammonium sulfate, 0.2 M NaCl, and 0.1 M sodium cacodylate pH 5.9 |
Crystal Data
| Unit Cell | |
|---|---|
| Length ( Å ) | Angle ( ˚ ) |
| a = 55.78 | α = 90 |
| b = 55.78 | β = 90 |
| c = 182.01 | γ = 90 |
| Symmetry | |
|---|---|
| Space Group | P 43 21 2 |
Diffraction
| Diffraction Experiment | ||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | |||||
| 1 | 1 | x-ray | 100 | CCD | ADSC QUANTUM 315r | 2011-09-09 | M | SINGLE WAVELENGTH | ||||||
| 2 | 2 | x-ray | 100 | PIXEL | DECTRIS PILATUS 6M | 2012-01-22 | M | MAD | ||||||
| 3 | 2 | x-ray | 100 | PIXEL | DECTRIS PILATUS 6M | 2012-01-22 | M | MAD | ||||||
| 4 | 2 | x-ray | 100 | PIXEL | DECTRIS PILATUS 6M | 2012-01-22 | M | MAD | ||||||
| Radiation Source | |||||
|---|---|---|---|---|---|
| ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline |
| 1 | SYNCHROTRON | ALS BEAMLINE 8.2.2 | 1.0 | ALS | 8.2.2 |
| 2 | SYNCHROTRON | SSRL BEAMLINE BL12-2 | 0.9792 | SSRL | BL12-2 |
| 3 | SYNCHROTRON | SSRL BEAMLINE BL12-2 | 0.9184 | SSRL | BL12-2 |
| 4 | SYNCHROTRON | SSRL BEAMLINE BL12-2 | 0.9798 | SSRL | BL12-2 |
Data Collection
| Overall | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | R Merge I (Observed) | Rrim I (All) | Rpim I (All) | CC (Half) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot | |||||
| 1 | 2.01 | 36.19 | 98.84 | 0.1033 | 0.1084 | 0.032 | 0.999 | 13.8 | 11 | 19869 | 40.96 | ||||||||
| Highest Resolution Shell | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | R Merge I (Observed) | Rrim I (All) | Rpim I (All) | CC (Half) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) | ||||||||
| 1 | 2.01 | 2.082 | 94.03 | 1.685 | 1.789 | 0.5814 | 0.438 | 1.16 | 9 | ||||||||||
Refinement
| Statistics | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Diffraction ID | Structure Solution Method | Cross Validation method | Resolution (High) | Resolution (Low) | Cut-off Sigma (F) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (Observed) | R-Work (Depositor) | R-Work (DCC) | R-Free (Depositor) | R-Free (DCC) | Mean Isotropic B | |||||
| X-RAY DIFFRACTION | MAD | FREE R-VALUE | 2.01 | 36.19 | 1.33 | 19844 | 994 | 98.53 | 0.223 | 0.2219 | 0.22 | 0.2417 | 0.24 | 50.04 | |||||
| Temperature Factor Modeling | ||||||
|---|---|---|---|---|---|---|
| Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] | |
| RMS Deviations | |
|---|---|
| Key | Refinement Restraint Deviation |
| f_dihedral_angle_d | 17.0452 |
| f_angle_d | 0.7196 |
| f_chiral_restr | 0.0426 |
| f_plane_restr | 0.0052 |
| f_bond_d | 0.0044 |
| Non-Hydrogen Atoms Used in Refinement | |
|---|---|
| Non-Hydrogen Atoms | Number |
| Protein Atoms | 1645 |
| Nucleic Acid Atoms | |
| Solvent Atoms | 39 |
| Heterogen Atoms | 23 |
Software
| Software | |
|---|---|
| Software Name | Purpose |
| PHENIX | refinement |
| XDS | data reduction |
| autoSHARP | phasing |
| XDS | data scaling |














