CTX-M-14 mixed with piperacillin at 3s delay time - serial crystallography temperature series; 20C, 293K
Serial Crystallography (SX)  
Starting Model(s)
| Initial Refinement Model(s) | 
|---|
| Type | Source | Accession Code | Details | 
|---|
|
experimental model | PDB | 6GTH |  | 
Crystallization
| Crystalization Experiments | 
|---|
| ID | Method | pH | Temperature | Details | 
|---|
| 1 | BATCH MODE | 4.5 | 293 | CTX-M-14 solution (22 mg/ml) was mixed with 
45% precipitant solution (40% PEG8000, 200mM lithium sulfate, 100mM 
sodium acetate, pH 4.5) and with 5% undiluted seed stock in batch 
crystallization setups | 
| Crystal Properties | 
|---|
| Matthews coefficient | Solvent content | 
|---|
| 2.17 | 43.35 | 
Crystal Data
| Unit Cell | 
|---|
| Length ( Å ) | Angle ( ˚ ) | 
|---|
| a = 42.15 | α = 90 | 
| b = 42.15 | β = 90 | 
| c = 234.2 | γ = 120 | 
| Symmetry | 
|---|
| Space Group | P 32 2 1 | 
|---|
Diffraction
| Diffraction Experiment | 
|---|
| ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | 
|---|
| 1 | 1 | x-ray | 293 | PIXEL | DECTRIS EIGER X 4M |  | 2021-12-04 | M | SINGLE WAVELENGTH | 
| Radiation Source | 
|---|
| ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline | 
|---|
| 1 | SYNCHROTRON | PETRA III, EMBL c/o DESY BEAMLINE P14 (MX2) | 0.976 | PETRA III, EMBL c/o DESY | P14 (MX2) | 
Serial Crystallography
| Sample delivery method | 
|---|
| Diffraction ID | Description | Sample Delivery Method | 
|---|
| 1 |  | fixed target | 
| Fixed Target | 
|---|
| Diffraction ID | Description | Sample Holding | Support Base | Motion control | Details | Sample Solvent | 
|---|
| 1 |  | Hare-Chip , silicon |  |  |  |  | 
Data Collection
| Overall | 
|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | CC (Half) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot | 
|---|
| 1 | 1.7 | 78.07 | 100 | 0.862 | 1.91 | 45.2 |  | 27981 |  |  | 26.44 | 
| Highest Resolution Shell | 
|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | CC (Half) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) | 
|---|
| 1 | 1.7 | 1.76 |  |  | 0.034 | 0.25 | 27.4 |  | 
Refinement
| Statistics | 
|---|
| Diffraction ID | Structure Solution Method | Cross Validation method | Resolution (High) | Resolution (Low) | Cut-off Sigma (F) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (Observed) | R-Work (Depositor) | R-Work (DCC) | R-Free (Depositor) | R-Free (DCC) | Mean Isotropic B | 
|---|
| X-RAY DIFFRACTION | MOLECULAR REPLACEMENT | FREE R-VALUE | 1.7 | 78.07 | 1.33 | 26826 | 1315 | 96.18 | 0.2295 | 0.2281 | 0.2293 | 0.2556 | 0.2573 | 36.58 | 
| Temperature Factor Modeling | 
|---|
| Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] | 
|---|
|  |  |  |  |  |  | 
| RMS Deviations | 
|---|
| Key | Refinement Restraint Deviation | 
|---|
| f_dihedral_angle_d | 14.5165 | 
| f_angle_d | 0.8613 | 
| f_chiral_restr | 0.0467 | 
| f_plane_restr | 0.0048 | 
| f_bond_d | 0.0018 | 
| Non-Hydrogen Atoms Used in Refinement | 
|---|
| Non-Hydrogen Atoms | Number | 
|---|
| Protein Atoms | 1941 | 
| Nucleic Acid Atoms |  | 
| Solvent Atoms | 165 | 
| Heterogen Atoms | 78 | 
Software
| Software | 
|---|
| Software Name | Purpose | 
|---|
| PHENIX | refinement | 
| CrystFEL | data reduction | 
| CrystFEL | data scaling | 
| PHASER | phasing |