Experiment: 9HTC

X-RAY DIFFRACTION

Serial Crystallography (SX)

Initial Refinement Model(s)
Type	Source	Accession Code	Details
experimental model	PDB	6HIH

Crystalization Experiments
ID	Method	pH	Temperature	Details
1	BATCH MODE		291	Final concentrations: 20 mg/mL protein, 50 mM HEPES pH 7.5, 34 % (v/v) polyethylene glycol 550, 500 mM MES pH 6.5, 5 mM ZnSO4.

Crystal Properties
Matthews coefficient	Solvent content
2.95	63.6

Symmetry
Space Group	P 21 3

Diffraction Experiment
ID #	Crystal ID	Scattering Type	Data Collection Temperature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1	1	x-ray	293	PIXEL	DECTRIS PILATUS3 6M		2019-12-05	M	SINGLE WAVELENGTH

Radiation Source
ID #	Source	Type	Wavelength List	Synchrotron Site	Beamline
1	SYNCHROTRON	DIAMOND BEAMLINE I24	0.969	Diamond	I24

Sample delivery method
Diffraction ID	Description	Sample Delivery Method
1	Oxford silicon chip	fixed target

Fixed Target
Diffraction ID	Description	Sample Holding	Support Base	Motion control	Details	Sample Solvent
1				Geobrick and Smaract

Measurement
Diffraction ID	Pulse Duration	Pulse Repetition Rate	Focal Spot Size	Pulse Energy	Photons Per Pulse
1	undefined (fs)			undefined (KeV)

Data Reduction
Diffraction ID	Frames Indexed	Crystal Hits	Frames Indexed	Latices Merged
1

Overall
ID #	Resolution (High)	Resolution (Low)	Percent Possible (Observed)	CC (Half)	R Split (All)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1	1.8	76.09	100	0.986	0.07	10.2	159.8		38525

Highest Resolution Shell
ID #	Resolution (High)	Resolution (Low)	Percent Possible (All)	Percent Possible (Observed)	CC (Half)	R Split (All)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	1.8	1.83	100		0.291	1.234	0.7	127.2

Statistics
Diffraction ID	Structure Solution Method	Cross Validation method	Resolution (High)	Resolution (Low)	Number Reflections (Observed)	Number Reflections (R-Free)	Percent Reflections (Observed)	R-Factor (All)	R-Work (Depositor)	R-Work (DCC)	R-Free (Depositor)	R-Free (DCC)	Mean Isotropic B
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	FREE R-VALUE	1.8	76.09	38523	2038	100	0.162	0.1605	0.1648	0.1946	0.1986	35.534

Temperature Factor Modeling
Anisotropic B[1][1]	Anisotropic B[1][2]	Anisotropic B[1][3]	Anisotropic B[2][2]	Anisotropic B[2][3]	Anisotropic B[3][3]

RMS Deviations
Key	Refinement Restraint Deviation
r_dihedral_angle_6_deg	15.525
r_dihedral_angle_3_deg	12.237
r_dihedral_angle_1_deg	10.561
r_lrange_it	10.187
r_scangle_it	8.971
r_scbond_it	5.953
r_dihedral_angle_2_deg	5.645
r_mcangle_it	4.6
r_mcbond_it	3.53
r_angle_refined_deg	2.514

RMS Deviations
Key	Refinement Restraint Deviation
r_dihedral_angle_6_deg	15.525
r_dihedral_angle_3_deg	12.237
r_dihedral_angle_1_deg	10.561
r_lrange_it	10.187
r_scangle_it	8.971
r_scbond_it	5.953
r_dihedral_angle_2_deg	5.645
r_mcangle_it	4.6
r_mcbond_it	3.53
r_angle_refined_deg	2.514
r_nbtor_refined	0.313
r_metal_ion_refined	0.28
r_nbd_refined	0.206
r_symmetry_nbd_refined	0.176
r_chiral_restr	0.131
r_xyhbond_nbd_refined	0.108
r_symmetry_xyhbond_nbd_refined	0.06
r_gen_planes_refined	0.013
r_bond_refined_d	0.012