Experiment: 9HU1

X-RAY DIFFRACTION

Serial Crystallography (SX)

Initial Refinement Model(s)
Type	Source	Accession Code	Details
experimental model	PDB	6HIH

Crystalization Experiments
ID	Method	pH	Temperature	Details
1	BATCH MODE		291	Final concentrations: 20 mg/mL protein, 50 mM HEPES pH 7.5, 34 % (v/v) polyethylene glycol 550, 500 mM MES pH 6.5, 5 mM ZnSO4.

Crystal Properties
Matthews coefficient	Solvent content
2.96	63.6

Symmetry
Space Group	P 21 3

Diffraction Experiment
ID #	Crystal ID	Scattering Type	Data Collection Temperature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1	1	x-ray	293	PIXEL	DECTRIS EIGER2 X CdTe 9M		2023-05-17	M	SINGLE WAVELENGTH

Radiation Source
ID #	Source	Type	Wavelength List	Synchrotron Site	Beamline
1	SYNCHROTRON	DIAMOND BEAMLINE I24	0.620	Diamond	I24

Sample delivery method
Diffraction ID	Description	Sample Delivery Method
1		fixed target

Fixed Target
Diffraction ID	Description	Sample Holding	Support Base	Motion control	Details	Sample Solvent
1	Oxford silicon chip			Geobrick and Smaract

Measurement
Diffraction ID	Pulse Duration	Pulse Repetition Rate	Focal Spot Size	Pulse Energy	Photons Per Pulse
1	undefined (fs)			undefined (KeV)

Data Reduction
Diffraction ID	Frames Indexed	Crystal Hits	Frames Indexed	Latices Merged
1

Overall
ID #	Resolution (High)	Resolution (Low)	Percent Possible (Observed)	CC (Half)	R Split (All)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1	2.15	75.82	100	0.984	0.188	12.9	69.9		22647

Highest Resolution Shell
ID #	Resolution (High)	Resolution (Low)	Percent Possible (All)	Percent Possible (Observed)	CC (Half)	R Split (All)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.15	2.19	100		0.279	1.017		58.1

Statistics
Diffraction ID	Structure Solution Method	Cross Validation method	Resolution (High)	Resolution (Low)	Number Reflections (Observed)	Number Reflections (R-Free)	Percent Reflections (Observed)	R-Factor (All)	R-Work (Depositor)	R-Work (DCC)	R-Free (Depositor)	R-Free (DCC)	Mean Isotropic B
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	FREE R-VALUE	2.151	61.984	22641	1097	99.996	0.198	0.1962	0.1962	0.2371	0.2369	39.596

Temperature Factor Modeling
Anisotropic B[1][1]	Anisotropic B[1][2]	Anisotropic B[1][3]	Anisotropic B[2][2]	Anisotropic B[2][3]	Anisotropic B[3][3]

RMS Deviations
Key	Refinement Restraint Deviation
r_dihedral_angle_6_deg	13.856
r_dihedral_angle_3_deg	13.484
r_lrange_it	9.014
r_dihedral_angle_1_deg	7.623
r_scangle_it	6.133
r_dihedral_angle_2_deg	5.535
r_mcangle_it	4.147
r_scbond_it	3.905
r_mcbond_it	2.867
r_angle_refined_deg	1.667

RMS Deviations
Key	Refinement Restraint Deviation
r_dihedral_angle_6_deg	13.856
r_dihedral_angle_3_deg	13.484
r_lrange_it	9.014
r_dihedral_angle_1_deg	7.623
r_scangle_it	6.133
r_dihedral_angle_2_deg	5.535
r_mcangle_it	4.147
r_scbond_it	3.905
r_mcbond_it	2.867
r_angle_refined_deg	1.667
r_nbtor_refined	0.316
r_symmetry_nbd_refined	0.303
r_nbd_refined	0.218
r_xyhbond_nbd_refined	0.13
r_symmetry_xyhbond_nbd_refined	0.105
r_chiral_restr	0.086
r_metal_ion_refined	0.026
r_bond_refined_d	0.012
r_gen_planes_refined	0.009